Understanding and Characterizing Side Channels Exploiting Phase-Change Memories
Published in IEEE Micro, 2023
Recent advances in nonvolatile memory (NVM), together with their performance-optimized architectural schemes, position NVMs as promising building blocks for future main memory. However, the security of such techniques has not been explored. This article performs the first study on information leakage threats in phase-change memories (PCM). We propose an attack framework, read-saw (R-SAW), that systematically investigates side channel vulnerabilities in representative read techniques under …
Recommended citation: M. H. I. Chowdhuryy, R. Ewetz, A. Awad, and F. Yao, “Understanding and characterizing side channels exploiting phase-change memories,” IEEE Micro, 2023.
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